June 4, 2013. The automated test equipment (ATE) field is moving ahead. In an effort to spotlight its advancements, in 2009 the IEEE Test Technology Technical Council and the Test Vision 2020 Workshop created the Best ATE Paper Award. Its purpose is to recognize papers that spurred advancements in the ATE field. In 2011, for example, this award went to an International Test Conference 2010 paper titled “A High Density Small Size RF Test Module for High Throughput Multiple Resource Testing” for its innovation in RF ATE Integration. Test Vision 2020 and the IEEE TTTC are now accepting recommendations for a paper published in 2012 that contributed to the advancement of the ATE field. The Award Selection Committee—François-Fabien Ferhani (Chair), Broadcom; George Giakos, University of Akron; Benjamin Brown, LTX-Credence; Ken Lanier, Teradyne; and Steve Tilden, LTX-Credence—will announce the Best 2012 ATE Paper Award nominees at the Test Vision 2020 Workshop in July. The winner will be announced in September. Send your recommendations to Dr. Ferhani at [email protected].
“Cascade's Ahlgren Offers Clear View of Semiconductor Test“—In an exclusive interview, Deb Ahlgren, vice president of marketing at Cascade Microtech and the vice general chair of the Test Vision 2020 Workshop, discusses test in general and the workshop in particular.
“Big Data Comes to Semiconductor Test“—Tom Morrow, vice president, SEMI, comments that big data and test will be principal discussion points on the Semicon West show floor and during conference sessions.
