November 1, 2013. A new application note explains how to overcome the challenges of testing LTE UE conformance to the 3GPP specifications by using a flexible test system based on a single hardware platform. It is the newest in the series of Agilent Power of X application notes created to provide insight into solving tough measurement problems in a unique way for both the design and manufacturing environments.
To obtain the application note “Solutions for LTE Conformance Testing” (5991-3300EN) or other free application notes go to www.agilent.com/find/powerofx. Registration is required.