NI simplifies measurement with new CompactDAQ controllers

April 1, 2015

NI has announced the new CompactDAQ 8-slot controller, which expands the CompactDAQ controller offering to meet high-channel-count applications in rugged environments. By integrating the processor, signal conditioning, and I/O into a single CompactDAQ system, engineers can reduce overall system cost and complexity while increasing measurement accuracy. Integrated measurement systems reduce the number of components, connections, and wiring needed, which often introduce noise and additional costs, to ensure high-accuracy measurements and cost-optimized systems.

Both the 4-slot and 8-slot CompactDAQ controllers feature an Intel Atom dual-core processor that can run either Windows Embedded 7 or NI Linux Real-Time. By pairing industry-standard OS options with LabVIEW system design software, customers can easily port LabVIEW code from existing measurement systems to these new CompactDAQ controllers. They can combine LabVIEW and over 60 sensor-specific I/O modules for CompactDAQ to quickly customize data acquisition systems to meet their application needs.

“We’ve expanded the CompactDAQ family by adding an 8-slot controller to give customers another rugged and integrated solution,” said Stefanie Breyer, director of data-acquisition R&D at NI. “The Intel Atom 3800 processor gives engineers powerful processing paired with high-accuracy measurements that can be used in a variety of applications from in-vehicle data logging to distributed measurements.”

Here are some key features of CompactDAQ controllers:

  • Integrated Intel Atom Dual-Core Processor: Reduce system complexity and take your measurement system anywhere by having an integrated processor built in.
  • Removable SD Storage: Forget about data storage limits with hot-swappable, removable SD storage.
  • Integrated CAN/LIN Port: Cut costs by taking advantage of the built-in CAN/LIN port.
  • Choice of Four or Eight C Series Module Slots: Mix and match a variety of I/O types, including AI, AO and DIO to meet your specific application needs.
  • Rugged Form Factor: Take measurements in high shock and vibration environments as well as temperatures ranging from -40 °C to 70 °C.

www.ni.com/compactdaq/controllers

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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