EM Test offers four-quadrant, bipolar voltage-drop simulators

April 27, 2015

EM Test now offers the VDS 200Q Series four-quadrant voltage-drop simulator that can source and sink current using a programmed voltage in both positive and negative polarities. The amplifier generates dips and drops, short interruptions, and voltage variations to simulate a wide range of phenomena occurring on a vehicle wiring harness.

With unlimited operation from -15 V to +60 V, this DC voltage source simulates a wide number of battery supply waveforms used by manufacturers in the automotive industry as well as for international quality standards. Uses include military, avionics, and automotive testing environments.

The VDS 200Q Series are fast bipolar amplifiers that operate across all four quadrants that sink as well as source current. This allows the new simulators to drive capacitive loads and absorb energy feedback from the DUT up to the nominal current.

A very low source impedance of less than 10 mΩ and a high bandwidth of 150 kHz (full signal) enable these new sources to support low voltage drop, class-leading inrush current, and extremely fast recovery.

The unique QuickStart feature allows parameters to be adjusted during test to evaluate the DUT’s susceptibility level. And while many manufacturer-specific waveforms, such as pulse 2b (per ISO 7637-2) and pulse 4 (per ISO 16750-2), are pre-programmed, adding an external signal generator allows the VDS 200Q to generate more complex waveforms.

Test routines are quickly programmed using the intuitive front panel with menus and function keys. The optional iso.control software automatically configures according to the connected EM Test generators and provides an easy to use interface for accurate control and reporting functions. The EM Test standards library is continually updated with the most current international and automotive manufacturers’ standards requirements.

The simulators can be used for test according to Audi, BMW, ISO, Mercedes-Benz, SAE, VW, and more specifications.

EM Test is a unit of AMETEK Compliance Test Solutions.

http://www.emtest.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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