ADLINK introduces 4-channel 12-bit 80-MS/s PCIe digitizer
ADLINK Technology Inc., a provider of cloud-based services, intelligent gateways, and embedded building blocks for edge devices that enable the Internet of Things (IoT), today announced the release of its new high-speed PCI Express digitizer, the PCIe-9814. It features four simultaneously sampled 80-MS/s input channels with 12-bit resolution, 40-MHz bandwidth, and up to 1 GB DDR3 onboard memory. The PCIe-9814 delivers compellingly accurate high dynamic performance in 76 dB SFDR, 64 dB SNR, and -75 dB THD, with up to 640-MB/s data streaming and value added functionality, enhanced price/performance, and maximum optimization for radar testing, power management monitoring, and nondestructive testing.
The PCIe-9814’s 80-MS/s sampling and 40-MHz signal bandwidth meet the requirements of medium frequency radar signal reception from IF radar receivers. The PCIe-9814 provides external digital trigger input for synchronous trigger radar signaling, while three extra synchronous digital inputs receive radar synch pulse signals or GPS IRIG-B code to support radar signal markers or synchronous time stamping used in radar testing.
The PCIe-9814’s FPGA-based 31-order FIR digital filter supports noise reduction when signal content is 20 MHz or less. Noise effects are reduced efficiently and signal visibility increased by rejecting out-of-band and background noise and unexcepted high-frequency signals, all with no extra programming demands. The FPGA-based FIR digital filter performs much faster than on the host, with no host CPU bandwidth occupied.
The PCIe-9814 supports Windows 8 and Windows 7 operating systems and is compatible with third-party software such as NI LabVIEW and Visual Studio.NET. In addition, ADLINK’s measurement APIs allow easy conversion of basic voltage/time measurement results with no need for extra programming.
http://www.adlinktech.com/PD/web/PD_detail.php?cKind=&pid=1524
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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