Optimal+ 6.0 offers real-time, big-data analytics from NPI to HVM
Holon, Israel. Optimal+ today announced the availability of Release 6.0 of its Semiconductor Operations Platform. This latest release debuts a new solution, EXACT (EXtreme Analytics and CharacTerization), to the Optimal+ family of products. Based on the growing demand for greater data collection and analytic performance, EXACT delivers big data performance to semiconductor manufacturing operations, leveraging the power of the HP Vertica Analytics Platform (see related article) to enable customers to take advantage of all of the data that is generated across their global, distributed supply chain, from new product introductions (NPI) to high-volume manufacturing (HVM).
EXACT addresses two major trends that are currently changing the environment of semiconductor manufacturing operations: the enormous growth in manufacturing data being created due to increasing device volumes and product complexity, and the desire to utilize all of that data to improve operational performance, whether it be measured as a function of product yield, quality, or productivity. EXACT takes a major step toward enabling customers to collect and manage all of their production data in a single database that can scale to meet the needs of any size semiconductor company, combined with the real-time performance necessary to analyze the most complex data queries.
In addition to the new EXACT solution, version 6.0 also includes numerous enhancements to the existing capabilities within the Optimal+ Semiconductor Operations Platform. Data-Feed-Forward, the ability to use manufacturing data across multiple test insertions, can now be used across multiple subcons regardless of their geographical location. The Sequoia customization and scripting environment, released last year, has been enhanced with an interactive capability that enables users to easily leverage the power of Sequoia through a drag-and-drop interface. Finally, 6.0 includes the ability to proactively verify tester hardware configurations by collecting data on instruments and licensing to alert the user if the selected configuration is not optimal for the product being tested.
“Version 6.0 is the next step in our vision to bring real-time, big data analytics to every aspect of semiconductor manufacturing,” said Dan Glotter, founder and CEO of Optimal+. “With the support of our customers, we are expanding our footprint from high-volume manufacturing into the NPI phases of manufacturing. Using the Big Data Highway that we have established across the global semiconductor supply chain, we are able to provide unparalleled capabilities for the analysis of manufacturing data, from characterization through volume production.”
