W2BI debuts battery-life test based on Keysight UXM

July 17, 2015

San Jose, CA. W2BI Inc., an Advantest Group company, has announced the availability of a battery life test solution for UE acceptance using Keysight Technologies’ UXM wireless test set. The test solution has been developed in accordance with a number of test cases as defined within the CTIA Battery Life Test Plan rev 1.0 and GSMA TS.09-v7.6.

The new solution enables a consistent and efficient way of smartphone battery testing that is based on real end-user behavior and is the result of collaboration between the two companies, where W2BI developed the scripts using Keysight’s UXM Wireless Test Set and N6705B DC Power Analyzer. The announcement was made during the CTIA CPWG Battery Life Working Group Meeting, held in Santa Rosa, CA, on July 14. CTIA-The Wireless Association, is an international nonprofit membership organization that has represented the wireless communications industry since 1984.

Derek DiPerna, president of W2BI, commented, “We are delighted to have worked in close partnership with Keysight to implement advanced automation of the CTIA Battery Life Test Plan with orchestrated configuration across all major LTE, GSM, WCDMA, eHRPD, and 1xRTT technologies. Our solution greatly simplifies testing while increasing speed and consistency.”

Satish Dhanasekaran, GM of the Mobile Broadband Operation of Keysight Technologies, added, “The collaboration with W2BI continues to extend the value of the UXM Wireless Test Set in addressing a wide variety of customers’ test needs. The power of our platforms, in combination with the test case automation from W2BI, provides a compelling reason for customers to select this solution. As the industry grapples with the challenge of making wireless devices more power efficient in the face of increasing data consumption, test solutions from Keysight and W2BI provide the tools that lead to greater insight in solving this challenging problem.”

www.w2bi.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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