Data Translation expands sound and vibration system to 256 channels

Marlboro, MA. By combining four rugged VIBbox-64 enclosures, Data Translation has expanded its sound and vibration measurement capability to 256 IEPE channels.

All channel data is available at the same time due to the simultaneous operation and parallel configuration for a throughput rate of 51.2 kHz on each channel. This parallel measurement capability assures that vibration data can be analyzed at the same instant in time without the time lapse and phase difference of multiplexed systems. IEPE inputs from sensors such as microphones and accelerometers that have a large dynamic range can be connected directly and measured at this very fast throughput. Common applications are acoustic, audio, and vibration testing on large structures such as airplane wings, turbines, trucks, and water vessels such as Navy ships before launching.

In addition to the 256 IEPE input channels, VIBbox in this large configuration also includes other I/O capability, including 32 stimulus D/A channels, 16 tachometer channels, and a plethora of digital I/O, counter/timer, and measure-counter channels.

VIBbox operates using the ready-to-measure QuickDAQ application with advanced FFT analysis as standard. The easy-to-use QuickDAQ application acquires data, analyzes the data, records the data to disk, and displays and plots the results.

According to Fred Molinari, president, “Large structures must be analyzed to determine the vibration effects from motors and engines. For example, a Navy ship must undergo stringent tests before launch at many different points to understand how it will perform at sea under duress of storms. VIBbox allows this capability now at 256 different points at the same exact instant in time, giving a complete panorama for analysis. The same measurement tests must be performed on aircraft, trucks, etc.”

www.datatranslation.com/Products/VIBbox-Sound-and-Vibration/VIBbox

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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