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IEEE Autotestcon 2015 final program set

Oct. 12, 2015

Organizers of IEEE Autotestcon 2015 have announced the availability of the final program. The event will be held at the Gaylord Convention Center & Hotel at National Harbor, MD, in the Washington DC area, November 2-5, 2015.

Organizers are offering free registration to all DoD civilian and active-duty military personnel, who are invited to spend three days networking with the top minds in the automatic test industry.

Organizers have announced two keynote speakers. John Johns, Deputy Assistant Secretary of Defense (Maintenance), will speak Tuesday November 3 during an 8 to 10:30 a.m. session, and Dr. James Truchard, president and CEO of National Instruments, will speak during a Wednesday morning 8 to 10:30 a.m. session. (Click for more.)

Four tutorials on Monday will be arranged in two sessions: session 1 covers “Automatic Testing from A to Z” from 8 a.m. to noon and “ATE and TPS Management” from 1:30 p.m. to 5:30 p.m. Session 2 begins with “Diagnostics and Design for Built-in Test” from 8 a.m. to noon. It concludes with a tutorial titled “VXI, PXI, IVI, LXI, and AXIe Standards Improve ATE Systems Design” from 1:30 p.m. to 5:30 p.m. (Click for more.)

The event will include three panel sessions on Wednesday November 4, addressing topics including Army ATS weapons system support, modular instrumentation, and design for testability. (Click for more.)

You can download the final program here:

http://autotestcon.com/content/final-program

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