Leti to host workshop during SPIE Photonics West
Grenoble, France. Leti will host a workshop from 4-6 p.m. on Tuesday, February 16, during SPIE Photonics West, focusing on some of its recent developments in photonics applications. Leti researchers also will present four invited papers plus 10 additional papers in conjunction with partners during the February 13-18 conference in San Francisco.
The workshop for invited guests at the St. Regis Hotel in San Francisco will feature a keynote presentation on “Photonic nanoprobes for massively parallel interrogation of brain activity,” by Michael Roukes, the Robert M. Abbey Professor of Physics, Applied Physics, and Biological Engineering at Caltech.
Following a welcome and introduction from Ludovic Poupinet of Leti, presentations at the Tuesday workshop will include
- “Miniaturized optical sensors for air-quality control and emissions monitoring,” by Sergio Nicoletti, Leti;
- “Monolithic LED arrays for smart-lighting and display applications,” by Ivan-Christophe Robin, Leti; and
- “Strategic technology trends to meet pervasive-imaging challenges,” by François Simoens, Leti.
Discussions, networking, and cocktails will follow the presentations.
Topics of the four invited papers at Photonics West include
- “Challenges in the monolithic integration of quantum cascade laser on silicon,”
- “Recent advances in silicon photonics,”
- “Monolithic LED arrays: next-generation sources for smart lighting applications,” and
- “Silicon photonic Mach Zehnder modulators for next-generation short-reach optical communication networks.”
Leti researchers also will join partners to present 10 additional papers on topics such as data-communications, sensing, and lighting.
Counted among the global research pioneers in silicon photonics, sensing, and lighting as well as displays and imaging, Leti has developed a technology portfolio to address the increasing requirements for optical communication systems for automotive, advanced manufacturing, security, biology and health, and smart building applications.
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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