Keysight offers hybrid-memory-cube compliance-test software

Feb. 5, 2016

Santa Rosa, CA. Keysight Technologies today introduced what it calls the industry’s first compliance test software application for hybrid-memory-cube (HMC) device and system testing. The Keysight N8839A HMC test application helps memory design engineers accelerate turn-on and debug of HMC systems by automating the execution of transmitter physical-layer tests on Keysight Infiniium V-Series and Z-Series oscilloscopes.

HMC technology is a new innovation in DRAM memory architecture and is designed with the highest memory performance and lowest power consumption and cost. These attributes enable HMC technology to support higher speed computer and network systems, such as the 100G and 400G infrastructure.

The Keysight N8839A HMC compliance test software application provides automated electrical, timing, and jitter tests. The software automatically configures the oscilloscope for each test and generates an HTML report at the end of the test. The report compares the results with the specified test limit and indicates how closely the device passes or fails each test. Engineers can easily debug signal-integrity issues using the N8839A software in conjunction with the switch-matrix option to connect to multiple data lanes at the same time.

“Our new HMC solution helps design engineers understand the effects of jitter on the data valid windows of their high-speed memory systems,” said Dave Cipriani, vice president and general manager of Keysight’s Oscilloscope and Protocol Division. “The Keysight Infiniium Z-Series high-performance oscilloscopes have industry-leading noise and jitter performance to help customers make HMC measurements with a high-degree of confidence that they will achieve maximum design margins.”

The Keysight N8839A HMC compliance test software application is available now and is priced at $3,000.

www.keysight.com/find/N8839A

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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