Averna launches infotainment RF source based on NI’s VST

Aug. 1, 2016

Austin, TX. Averna today at NIWeek launched what the company calls the first all-in-one infotainment RF signal source based on the NI vector signal transceiver.

The software-defined AST-1000 can generate all common infotainment RF signals, including AM/FM, DAB, GPS, HD Radio, and Sirius/XM. This all-in-one solution is suitable for validating automotive infotainment systems.

Due to the AST-1000’s software-defined architecture, this instrument will soon accommodate new signals, including connectivity protocols like Bluetooth and WiFi, and non-RF signals like CAN for bus monitoring. The source’s FPGA framework easily accommodates new signals, saving on instrument costs

In addition, the source features seamless integration with Averna URT instruments to protect customer investments, and it offers an easy-to-use interface for quick signal generation and easy test setups. The flexible PXIe architecture allows integration of other applications/cards. In addition, the source is rack-mountable and can handle lab validation as well as functional and EOL testing.

“We’ve been working closely with the team at NI to develop an RF signal source based on the NI vector signal transceiver, so it’s fitting to launch our AST-1000 during NIWeek 2016,” said Alex Pelland, product marketing manager at Averna. “The AST-1000 is an innovative software-defined instrument, ideally suited for infotainment testing applications. It currently supports all common broadcast radio and will soon be able to accommodate new signals, such as navigation (GNSS), audio/video, and connectivity.”

“The Averna AST-1000 is a great example of bringing innovative test solutions to market through our Alliance Partner Network by combining Averna’s extensive industry knowledge with NI’s flexible PXI-based platform,” said Michael Schneider, principal product manager at National Instruments. “The AST-1000 is sure to appeal to automotive infotainment developers who want a software-defined instrument that will continue to evolve to cover their ongoing test requirements.”

www.averna.com/AST-1000

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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