Circuit Check and ASSET InterTech collaborate on boundary-scan test

Jan. 20, 2017

Minneapolis, MN. Circuit Check Inc., a global provider of test, automation, and interfacing solutions for electronics and electromechanical device manufacturers, announced a collaboration with ASSET InterTech to more closely integrate ASSET’s ScanWorks boundary-scan test tools with CCI’s flexible, configurable, functional test systems, the CCI 1000 Series Configurable ATE and CCI 6000 Series Rotary Handler.

“Greater circuit board densities, finer pitches, and higher I/O and memory speeds are driving the importance of functionally exercising products at functional-level PCBA test and end-product subassembly. Combining net and pin-level diagnostics along with boundary-scan test is an ideal solution to the complexities of today’s designs,” said Greg Michalko, CEO of Circuit Check.

A key to achieving the maximum value from automated test equipment is using the same test equipment and fixture mechanics to test multiple products. Circuit Check’s 1000 Series ATE achieves this by using interchangeable fixturing, as well as interchangeable fixture drop-ins. These components enable the same test system to be quickly reconfigured with new tooling for different products, maximizing equipment re-use while minimizing the cost for each new test. The CCI 1000 supports probes on the topside, bottom-side, bi-level, or dual stage, as well as through-connector test and line-automation.

“CCI’s functional test solutions lead its industry and are broadly adopted within numerous market segments, particularly medical, military, and aerospace applications”, said Alan Sguigna, vice president of sales for ASSET. “As the need to thoroughly and confidently test and diagnose mission-critical systems continues to grow, boundary-scan capability integrated within functional test ensures test completeness.”

The CCI 6000 Rotary Handler can perform a variety of functions, such as functional test, flash programming, vision inspection, through-connector test, and marking. “A drop-in fixture option allows for quick change from one product to the next, usually within minutes”, said Michalko. “Today’s complex mission-critical products often require probe access and though-connector test methods. Adding a seamlessly integrated end-user experience with boundary scan into our test solutions, helps our customers ensure quality in production for their technologies.”

www.circuitcheck.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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