ON Semiconductor’s PYTHON 480 sensor allows drones to avoid collisions
The 1/3.6-inch SVGA CMOS image sensor with its large, highly sensitive 4.8-µm pixels enables the capture of moving objects without any artifacts with single-digit noise performance. It provides a high SVGA frame rate of 120 fps with a compact CSP package and a small footprint. This allows a very small camera design and significant power saving, as well a battery-powered mobile operation. These features are especially suitable for eyes of robots, surveillance systems, and unmanned aerial vehicles. Up to four regions of interest can be programmed, achieving higher frame rates for special focused areas. A separate synchronization channel containing payload information is provided to facilitate the image reconstruction at the receiving end. The device provides a high speed serial or parallel CMOS output.
Sibel Yorulmaz-Cokugur, ON Semiconductor’s line manager at FRAMOS, explains the 480 sensor’s unique features and customer applications benefits: “The 480 has improved image and recognition quality. The highly sensitive pixels support low-noise ‘pipelined’ and ‘triggered’ global shutter readout modes. Furthermore, the correlated double sampling (CDS) support in global shutter mode results in reduced noise and increased dynamic range. A high level of programmability allows the reconfiguration of integration time and gain-parameters by on-chip programmable gain-amplifiers and 10-bit A/D converters without any visible image artifact. Optionally, the on-chip automatic exposure control loop (AEC) controls these parameters dynamically. The image’s black level is either calibrated automatically, or adjusted by adding a user-programmable offset.”
Engineering samples of the PYTHON 480 will be available in monochrome and Bayer color configurations in early 2017. Industry and product experts at FRAMOS are available to support customers in integrating these new sensors in their applications and projects. In addition, FRAMOS also provides services such as development support, customizations, and logistics.
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
Comment About the Article
To join the conversation, and become an exclusive member of Electronic Design, create an account today!
Leaders LogoLeaders relevant to this article:

