Rohde & Schwarz introduces 6-GHz multi-domain lab scope

Feb. 6, 2017

Munich, Germany. Rohde & Schwarz has added a new 6-GHz model to its R&S RTO2000 Series, opening up measurements on fast communications interfaces and for IoT applications. The characteristics of the compact R&S RTO2000 lab oscilloscopes make them suitable for demanding tasks such as power-integrity measurements.

The new R&S RTO2000 with 6-GHz bandwidth allows developers to test the radio interfaces of 802.11ac WLAN components for IoT modules in the 5-GHz band as well as fast communications interfaces such as USB 3.1 Gen 1 with data rates of 5 Gb/s. Thanks to its multi-domain functionality, a single compact instrument can analyze power supplies, processors, and sensors. Synchronized time, frequency, protocol, and logic-analyses results allow users to debug at the system level.

The company said the R&S RTO2000 offers users the best oscilloscope performance in its class. Up to 16-bit vertical resolution in high definition mode enables developers to detect even the smallest of signal details. Further, the company said, the R&S RTO2000 is the only oscilloscope to offer one million waveforms per second, allowing fast identification of even the most sporadic signal faults. The integrated spectrum-analysis and spectrogram display make it possible to observe the signal path in the frequency domain as well as over time.

The zone trigger for the time and frequency domain supports developers in their day-to-day tasks. This function lets them isolate events graphically in the time and frequency domain, for example, in order to separate read and write messages from memory interfaces. The R&S RTO2000 offers a 2-Gsample memory, so users can analyze even long pulse and protocol sequences. They can also use the history function to retrieve previously acquired waveforms. The high-resolution, 12.1-inch touchscreen and the color-coded controls make the R&S RTO2000 intuitive to use. The app cockpit provides direct access to all available applications, such as trigger and decoding functions, conformance and signal integrity-tests, I/Q analysis, and even customer-specific development tools.

www.rohde-schwarz.com/ad/press/rto2000

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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