Xcerra introduces 12.8-Gb/s SerDes test instrument

Milpitas, CA. The new Xcerra HSI1_X instrument for the Diamond_X platform features 32 transmit lanes and 24 receive lanes with data rates to 12.8 Gb/s. The instrument can be used for protocol and physical-layer testing of leading-edge SerDes ports found on the latest applications processors, flat panel display devices, and other high-performance ICs supporting PCIe, V-by-One HS, HDMI, USB, and MIPI interfaces.

The latest application processor and related ICs require greater than 6.4-Gb/s performance and have increased lane counts. Furthermore, many ports are mixed-mode, requiring both embedded-clock and forwarded-clock operation. With 32 transmit and 24 receive lanes per instrument running at up to 12.8 Gb/s, HSI1_X provides high channel density and cost-effectiveness, allowing for high multisite full-functional testing, resulting in lowe cost of test.

HSI1_X builds on the established Diamond_X HSIO instrument and enhances the capabilities to meet the advanced test requirements: The HSI1_X has 3.5 times the lane count and twice the data rate of the HSIO instrument and adds programmable lane-to-lane timing alignment.

The HSI1_X features true parallel clock-data recovery and bit-error-rate testing, built-in PRBS pattern generation, deep user-programmable pattern memory, and flexible jitter and equalization settings.

Christopher Lemoine, product marketing director, said, “Xcerra has long legacy of leading-edge SerDes solutions. Working closely with our customers, we have developed this new instrument to support the test needs of next-generation applications processors, flat-panel display drivers, display timing controllers, and other high-data-rate devices, with cost effectiveness that is unmatched in the ATE industry. Combined with the ground-breaking efficiency and scalability of the Diamond_X platform, the HSI1_X is a compelling solution for the latest mobility, consumer, and automotive devices.”