Automated Test Equipment System Scales To Price/Performance Needs

Sept. 29, 2003

Based on a new NPower open architecture and XTOS (eXtendable Test Operating System) software, the Sapphire NP automated test equipment (ATE) reduces cost by being scalable to suit different price/performance requirements. According to NPTest, Sapphire's developer, the system supports the capabilities needed for the wide range of system-on-a-chip test demands, from design to production.

"More than an incremental evolution, Sapphire NP is a radical departure—the disruptive technology—that the industry has been waiting for," says Ashok Belani, CEO of NPTest. "Its unique architecture and programming environment enable the implementation of low-cost production strategies on the same platform. Unlike traditional 'big iron,' however, it does this without burdening the user with the overhead cost of a bulky system infrastructure. This will dramatically change the fundamental ATE landscape."

The system's 4D scalable architecture lets users choose the level of price/performance and functionality they need. The system can be optimized from dc to multigigahertz capabilities for digital and analog structural and functional testing.

The NPower Isochronous Fabric Interface enables advanced communications and precise synchronization between instruments. It enhances system performance in any configuration. XTOS software uses industry-standard STIL, Java, and XML, allowing test engineers to easily link to EDA tools. A host of test tools are available for test-program generation and deployment to production. PC and Windows-based, the tools support a large number of applications and are easily customizable.

Prices for the system start at $200 per pin for basic dc scan tests, with availability scheduled for the third quarter.

NPTest Inc.www.nptest.com (408) 586-6738

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About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.