Test & Measurement: Test Cards Expand Functionality Of Multichannel I-V Test System

Jan. 19, 2004

The model 4510 and 4511 quad I-V cards provide four source-measure channels in each of nine slots on the company's model 4500-MTS PCI mainframe I-V test system, allowing up to 36 I-V measurement channels at a lower cost than a comparable rack-and-stack system. Each card's input channel offers a high-power current-source subchannel with an extra 10-µA range, a low-power ±10-V dc full-scale voltage-source subchannel, and a 5-1/2-digital analog-to-digital converter. The 4510 features three full-scale outputs of ±30 mA, ±100 mA, and ±500 mA, and the 4511 has output ranges of ±100 mA, ±300 mA, and ±1.0 A. Now available, each card costs $7995, and the 4500-MTS starts at $8995.

Keithley Instruments Inc.www.keithley.com; (888) 534-8453

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.