Eye Diagrams, Bathtub Curves, And Bit-Error Rates

Feb. 2, 2004
On an oscilloscope's eye-pattern diagram, the distance between peak deterministic and random jitter amplitudes (the unit interval, or UI) is often called a "bathtub," which functions as a bit-error-rate (BER) indicator (...

On an oscilloscope's eye-pattern diagram, the distance between peak deterministic and random jitter amplitudes (the unit interval, or UI) is often called a "bathtub," which functions as a bit-error-rate (BER) indicator (see the figure, a). An eye-pattern diagram is a good method for quickly visualizing and accurately measuring timing jitter (see the figure, b).

Typical communications applications usually seek a BER of about 1 × 10-12. The eye pattern is formed by applying the repetitively sampled digital data signal to the oscilloscope's vertical input and the data clock rate that triggers the oscilloscope's sweep speed to the horizontal input.

Timing jitter is a critical measurement. A communication-system receiver's ability to track jitter in the incoming data stream is related directly to the error performance of that system. Jitter is typically defined in terms of UIs. A UI is the timing of the digital data when it transitions from its ideal (jitter-free) locations. The data transitions occur nominally at multiples of one UI, which is equal to the inverse of the bit rate.

Bit-error-rate testers (BERTs) can generate the distinctive bathtub curve characterizing the relationship between the BER and the fraction of the UI that's available for strobing data. As a result, designers can provide evidence that a design meets its intended applications.

About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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