ATE System Knocks Down Cost Of Signal-Integrity Test

May 24, 2004
High-speed serial link testing gets a price break with Agilent's BIST Assist 6.4. According to the company, this extension of its 93000 SoC series of automatic test equipment (ATE) costs 50% less than conventional at-speed ATE production systems....

High-speed serial link testing gets a price break with Agilent's BIST Assist 6.4. According to the company, this extension of its 93000 SoC series of automatic test equipment (ATE) costs 50% less than conventional at-speed ATE production systems.

Signal-integrity testing at up to 6.4 Gbits/s using a loopback/BIST (built-in self-test) approach is possible for $995,000. The cost drops under $20,000 for designers who already own a 93000 system, based on the number of channels needed and other factors.

BIST Assist 6.4 offers a complete solution for testing high-speed serial interfaces like PCI Express, Serial ATA, Fibre Channel, and Serial RapidIO. It combines traditional at-speed testing of expensive ATE systems with less expensive loopback testing without a large price tag.

"We're launching our customers into the next frontier of test where they do not have to sacrifice results for low cost," says Tom Newsom, vice president and general manager of the SoC Business Unit.

BIST Assist 6.4 provides at-speed level control and precision as well as adjustable jitter injection up to 430 ps. It's calibrated within the test head. Each BIST Assist 6.4 card provides four loops (16 differential pins) operating at the top rate of 6.4 Gbits/s. A graphical user interface ensures rapid test-program creation and implementation.

Agilent Technologieswww.agilent.com
(877) 424-4536

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About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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