In-Circuit Test System Enables Higher Throughput

Dec. 7, 2023
According to Keysight, its i3070 Series 7 In-Circuit Test systems delivers the shortest signal path between measurement circuitry and devices under test.

Keysight's family of i3070 Series 7 In-Circuit Test (ICT) systems delivers the shortest signal path between measurement circuitry and devices under test. As a result, it minimizes undesired effects from parasitic capacitance, improves immunity to crosstalk, and eliminates stray signal coupling effects for consistent and repeatable measurements.

The I3070 Series 6 ICT tester supports a wide range of printed-circuit-board assembly sizes for applications such as IoT and 5G devices, as well as automotive and energy systems. The i3070 features a novel design that delivers consistent and repeatable measurements, and all Series 6 products are fully backwards-compatible with previous systems.

Features include an improved test efficiency, with over 40% faster silicon nails/boundary-scan testing and over 6% faster testing on most PCBAs. Certified machine-to-machine capabilities such as IPC Connected Factory Exchange (IPC-CFX) and IPC-HERMES-9852 standards offer increased operation efficiency, greater test data insights, shorter response times, and reduced operating expenses.

The new i3070 Series 6 platform provides transportable test capabilities and adds Industry 4.0 technology for high yield, fast throughput, and best-in-class operational efficiency.

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