Learn ABCs Of JTAG Boundary-Scan Testing With Software Bundle

Aug. 23, 2004

Boundry-scan testing (IEEE1149.1/JTAG) is a novel procedure for some test engineers and technicians. But ScanWorks Interconnect Development Station version 3.4 from Asset Intertech should ease their transition to developing and deploying Joint Test Access Group (JTAG) tests. The ScanWorks bundle includes hardware and preconfigured software at an affordable price.

The bundle includes several key features. ScanWorks Assistant guides users through the test-development process. Scan Path Discovery automatically locates boundary-scan devices in the design. Scan Path Verify, which validates the design's boundary-scan infrastructure, contains a Web-based library of device models that eliminates model development time. TopCat productivity enhancements streamline test development. And, automated programmable-logic device (PLD) programming speeds up in-system reconfiguration.

Designers could use the bundle's PCI-100 boundary-scan controller hardware kit to quickly apply tests. A debug capability offers an effective means to find defects. An operator application interface (sequencer) simplifies test deployment in a manufacturing setting as well.

The ScanWorks Interconnect Development Station isn't limited to these features, though. Users can expand it to cover more sophisticated JTAG boundary-scan testing applications.

Limited-term licensing for the version 3.4 bundle begins at $6000. Standard and network licenses are available.

Asset Intertech Inc.www.asset-intertech.com (888) 694-6250

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About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.