Scope Scoop: Jitter Analysis Software Boosts Performance

Nov. 15, 2004
Faster, more accurate, and easier-to-use jitter and timing measurements are possible for Tektronix's oscilloscopes thanks to Version 2 of the company's TDSJIT3 Measurement Wizard software package. Several manual functions have been automated,...

Faster, more accurate, and easier-to-use jitter and timing measurements are possible for Tektronix's oscilloscopes thanks to Version 2 of the company's TDSJIT3 Measurement Wizard software package. Several manual functions have been automated, too.

The package auto-sets the source threshold levels, but it will provide an override for unusual cases. Measurement-configuration and source-configuration screens are now separated for a more intuitive way to show how each collection of configuration settings may affect results. Single measurements can be made using a guided interface, which guides users through a set of configuration screens. And, it's possible to correlate jitter amplitude measurements with phase-noise measurement thanks to a new special phase-noise plot.

The software reliably and accurately analyzes jitter on signals with repeating and nonrepeating data patterns, including spectral averaging and spectral peak hold. This is critical where spurious noise is random or "flickers" on and off. It's also vital for the capture of short events to show that certain high-magnitude impulses deserve further investigation.

Another feature is RJ and TJ measurement at bit-error rates on arbitrary patterns. Measurement of data signals can occur even when the user doesn't have full control of data content. Filters are provided for clock and data measurements.

The software package costs $4500.

Tektronix Inc.www.tektronix.com (800) 833-9200
About the Author

Roger Allan

Roger Allan is an electronics journalism veteran, and served as Electronic Design's Executive Editor for 15 of those years. He has covered just about every technology beat from semiconductors, components, packaging and power devices, to communications, test and measurement, automotive electronics, robotics, medical electronics, military electronics, robotics, and industrial electronics. His specialties include MEMS and nanoelectronics technologies. He is a contributor to the McGraw Hill Annual Encyclopedia of Science and Technology. He is also a Life Senior Member of the IEEE and holds a BSEE from New York University's School of Engineering and Science. Roger has worked for major electronics magazines besides Electronic Design, including the IEEE Spectrum, Electronics, EDN, Electronic Products, and the British New Scientist. He also has working experience in the electronics industry as a design engineer in filters, power supplies and control systems.

After his retirement from Electronic Design Magazine, He has been extensively contributing articles for Penton’s Electronic Design, Power Electronics Technology, Energy Efficiency and Technology (EE&T) and Microwaves RF Magazine, covering all of the aforementioned electronics segments as well as energy efficiency, harvesting and related technologies. He has also contributed articles to other electronics technology magazines worldwide.

He is a “jack of all trades and a master in leading-edge technologies” like MEMS, nanolectronics, autonomous vehicles, artificial intelligence, military electronics, biometrics, implantable medical devices, and energy harvesting and related technologies.

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