Semiconductor Capacitance-Voltage (C-V) Testing Fundamentals

This seminar is designed to introduce the topic of C-V measurements as they relate to semiconductor device and materials characterization. C-V testing is commonly used to determine semiconductor parameters such as doping profiles, density of interface states, threshold voltages, oxide charge, and carrier lifetime.

What you will learn:

• What is C-V testing
• What types of devices can C-V testing be used to characterize
• Who can use C-V
• C-V measurement challenges

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