EE Product News

Test Clips Employ Spring Probe Design

Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the TSOPII style package, in pin counts of 50, 54, 66, and 86, and lead pitches of 0.80 mm to 0.50 mm. As the clip is placed on the device, probe points facing up, each package leg comes in direct contact with a spring probe. The clip bottom is secured over the device by two miniature side latches located on each end. Users can regulate the clip’s tightness by adjusting a miniature screw located on each side-latched end with an Allen wrench. Additionally, off-the-shelf, semi-custom, and custom accessories are available for connecting the clip to a wide range test of equipment. Available in 0.50 mm and 0.80 mm lead pitches, pricing for the test clips (part number CLIP-054-T212-4) starts at $820. EMULATION TECHNOLOGY INC., Santa Clara, CA. (408) 982-0660.


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