EE Product News

Module Extends Reach Of Boundary-Scan Testing

Representing an extension of a line of boundary-scan tools for testing complex pc boards, the DIMM128 Digital I/O Scan (DIOS) module allows parallel driving and sensing of test points via a JEDEC-compatible connector interfaced with the firm's boundary-scan systems. Supporting both 3.3V and 5V operation and conforming to JEDEC Standard 21-C for 168-pin DIMM modules, the DIMM128 DIOS module is designed to extend the reach of boundary-scan testing to include, for example, elements on a target circuit board, such as board edge connectors or non-boundary-scan logic clusters, that are not directly accessible via boundary-scan.
The new module is said to integrate easily in a production test fixture or on a target board, as well as to provide close access to test points. And up to ten DIMM128 modules can be daisy-chained together, each providing 128 parallel channels controlled via boundary-scan. The channels can be individually programmed as input, output, bi-directional, or tristate signals. DIMM128 DIOS modules cost $750 each.


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