The E1 set supports development-stage immunity testing of PCB assemblies against EFT/Burst disturbances. It injects defined disturbance currents into selected electronic areas to identify weak points and analyze Burst-related-failures. Magnetic and electric field sources enable targeted near-field-disturbance, while sensors and optical signal transmission provide feedback on disturbance effects. With pulse peak values up to approximately 1,500 V, the compact system offers a cost-effective solution for EMC troubleshooting and evaluating counter-measures directly at the developer’s workplace.

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