Morning highlights—chips, clouds, motion, and vision

RF and microwave test topics have been in the news this week, driven in part by European Microwave Week, where Agilent and National Instruments made several announcements, and CTIA Enterprise & Applications 2011, where octoScope introduced its octoFade software, which implements IEEE 802.11n standard channel models.

In related communications-test news, Spirent Communications said its cloud-computing testing solution has been selected to validate the performance of network designs created within the Junosphere Lab virtual environment. Junosphere Lab will include Spirent TestCenter Virtual to provide visibility into network infrastructures, as well as to accurately benchmark and optimize performance.

And there is other news as well. On the semiconductor test-and-inspection front, Rudolph Technologies Inc. announced it has received the first orders for its defect-inspection and thin-film metrology tools capable of supporting integrated circuit manufacturing on 450-mm silicon wafers. And Verigy, planning its first VOICE group meeting and partners conference as part of Advantest, has issued a call for papers.

In still other news, National Instruments has introduced a reconfigurable Camera Link frame grabber for embedded vision applications and a motion module for the NI CompactRIO platform. The NI PCIe-1473R frame grabber is a PC-based embedded vision board that combines FPGA technology with a Camera Link interface; the NI 9502 brushless servo drive C Series module enables engineers to drive brushless servo motors, including six new custom NI motor options, directly from the reconfigurable CompactRIO system.

And finally, Keithley has issued a CD on source-measure-unit applications, and Stackpole announced a series of thin-film precision chip resistors that target test equipment applications.

Posted 10/13/2011 8:57 AM.

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