Chestnut Ridge, NY, and Santa Clara, CA. Teledyne LeCroy, is showcasing its latest innovations in test technology at DesignCon in Santa Clara this week. Exhibit highlights include the company’s 100-GHz bandwidth real-time oscilloscope, the HDO family of 12-bit high definition oscilloscopes, PAM-4 signal analysis, USB 3.1 and power delivery compliance test, MIPI M-PHY physical- and protocol-layer test, PCI Express Tx/Rx compliance with a receiver/transmitter test instrument certified for PCIe link equalization testing, and DDR compliance and debug capabilities.
The 10-100Zi-A 100-GHz oscilloscope demonstrates a long running commitment by Teledyne LeCroy to leadership in the high-end oscilloscope market, aggressively pushing real-time bandwidth and sample-rate boundaries to achieve 100-GHz and 240-GS/s, respectively.
DesignCon attendees have the opportunity to interact with Teledyne LeCroy design engineers and technical experts in a variety of venues. A series of ten 15-minute talks will be presented in booth 735 over the two days of the exposition. Topics relate to the instrument and application demonstrations, and in addition include engineering lessons by signal-integrity expert Dr. Eric Bogatin at 1 p.m. on both days. A complete schedule of speakers and topics can be found at teledynelecroy.com/designcon.
Other contributions to the technical conference include “PAM-4: New Measurement Science for New Signal Technologies” presented in the Chiphead Theater on the expo floor on Thursday at 1 p.m. by Dr. Martin Miller and Dr. Patrick Connally. Dr. Miller is scheduled to participate on a panel with industry jitter experts on Tuesday, while Stephen Mueller joins a Thursday panel session titled, “PAM-4: New Measurements are Coming.”
