MTS to show semiconductor test capabilities at SEMICON West
Irvine, CA. Marvin Test Solutions, a provider of globally deployed test solutions for military, aerospace, and manufacturing organizations, will feature its TS-960 semiconductor test platform, the newest addition to the TS-900 Series, at SEMICON West 2016 July 12-14 in San Francisco, CA.
“Our semiconductor customers asked for an alternative to big-iron ATE systems that would combine the features of high-end ATE with the open architecture and benefits of the PXI standard,” said Steve Sargeant, CEO of Marvin Test Solutions. “Our TS-960 platform, which incorporates our advanced GX5296 digital subsystem and associated software tools, offers customers the flexibility and value of the PXI platform with the high-performance test capabilities typically found only in high-end ATE systems.”
The TS-960 platform features a 20-slot, 3U PXI chassis accommodating up to 512 125-MHz digital I/O channels with PMUs per pin, yet has a small footprint and modular structure, allowing users to address a range of test applications. Available for the bench top or with an integrated manipulator, the TS-960 platform takes full advantage of the PXI architecture to achieve a full-featured test solution for digital, mixed – signal or RF test applications.
The GX5296 delivers high-performance digital test capabilities and is suitable for addressing verification, focused production, and failure analysis test needs—or for replacing legacy test systems. The GX5296 builds on the GX5295 PXI digital subsystem, offering timing, density, memory, and sub-nanosecond timing per pin capabilities. And with the addition of MTS’ software tools for program development and debug and comprehensive file conversion tools for WGL, VCD/eVCD, STIL , and ATP formats; the TS-960 provides digital and mixed-signal test capabilities for component, SoC, and SiP devices.