Rohde & Schwarz debuts entry-class R&S FPC1000 spectrum analyzer
Munich, Germany. Rohde & Schwarz has introduced the R&S FPC1000, a new entry-class spectrum analyzer, which, the company reports, features a flexible keycode upgrade concept, solid RF performance, the largest and highest-resolution display in this class, and integrated Wi-Fi for wireless remote control via mobile apps.
Engineered in Germany and designed to the same quality standards as high-end Rohde & Schwarz instruments, the R&S FPC1000 is suitable for basic research, production, service, and educational applications that require spectrum analysis.
The base model of the R&S FPC1000 covers a frequency range from 5 kHz to 1 GHz, which can be expanded to 2 GHz or 3 GHz via software upgrades. Upgrades can be purchased as needed and are available as soon as the keycode is entered. Recalibration is not required.
A critical characteristic when measuring extremely weak signals is high sensitivity. The R&S FPC1000 provides a low noise floor level of -150 dBm (typ), which can be further extended to –165 dBm (typ) with an optional keycode-activated preamplifier. Its high maximum input power allows users to measure RF signals up to +30 dBm (1 W). The combination of low noise floor and high maximum input power results in a wide measurement dynamic range.
The company said the R&S FPC1000 offers the best measurement resolution in its class with 1-Hz RBW and a 10.1” (26 cm) display.
Virtual control enables easy remote control and measurement. The R&S FPC1000 supports optional Wi-Fi connectivity in addition to wired Ethernet. With R&S InstrumentView for Microsoft Windows and the iOS/Android app based R&S MobileView platforms, measurements can be performed anywhere, anytime.
Rohde & Schwarz is demonstrating the R&S FPC1000 to the public for the first time at the embedded world 2017 international trade fair in Nuremberg, Germany, this week. The R&S FPC1000 available now from Rohde & Schwarz and selected distribution channel partners.
About the Author
Rick NelsonRick Nelson
Contributing Editor
Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.
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