Design Briefs: Equations for determining common-mode performance

Using Equation 2 (below) with Excel can be a useful tool in determining a range of possible CMRR values given a resistor tolerance. First, generate a set of random numbers with a normal distribution based on the tolerance you intend to use in...

Using Equation 2 (below) with Excel can be a useful tool in determining a range of possible CMRR values given a resistor tolerance. First, generate a set of random numbers with a normal distribution based on the tolerance you intend to use in the design (mean = 0.0, and standard deviation = 0.04—for a 0.1% resistor 2 x 1 % / 5 Σ). Use this random number as a factor to generate a set of resistance values that are adjusted for tolerance. The resistance values are applied to Equation 2 to generate a distribution of common-mode outputs that varies according to the tolerance of the resistors.

Equation 2: Differential Output Using Unique Resistor Values:

The figure shows distributions generated for 0.1% resistors using this technique.

A prototype of this circuit was used to verify that CMR fell within the predicted distribution. Note that the CMR could be dramatically improved using a trim potentiometer in series with R1. The prototype circuit's CMR was adjusted to greater then 100 dB through trimming.

The maximum common-mode input occurs when the voltage at the THS4130's inputs exceeds the maximum common-mode input voltage range. The relationship for this voltage was derived through nodal analysis (Equation 3, below). Applying the values shown in Figure 1 predicts that the voltage at node "w" will be Vw = 4.5 V with a 90-V common-mode signal. This is the specified maximum common-mode input voltage for the THS4130. Empirical measurements verify that the circuit's maximum common-mode input is 90 V.

Equation 3:

About the Author

Art Kay

Art Kay

Application Engineer, Texas Instruments

Art Kay is an application engineer in the precision amplifiers team at Texas Instruments. He specializes in the support of low-noise data-acquisition systems, and has published a book on intrinsic noise analysis. He also co-published a useful summary of analog engineering relationships (TI’s Analog Engineer’s Pocket Reference) and a companion software tool. Art was instrumental in the development of an online training program for amplifiers and data converters, and has conducted many live seminars on the subject.

Before working in applications engineering, he was a semiconductor test engineer for Burr-Brown and Northrop Grumman Corp. Art graduated from Georgia Institute of Technology with a MSEE and from Cleveland State University with a BSEE.

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