Bracknell, UK. Tektronix announced that the company will be showcasing a range of optical test and measurement products and solutions at ECOC 2015, which takes place from September 28-30 in Valencia, Spain.
Tektronix will highlight a range of applications to test the world’s most complex components for coherent optical and communication design:
- 40-Gb/s stressed pattern generation for high speed datacom and telecom test,
- 40-Gb/s multichannel BER measurements and analysis for stressed receiver testing of data communications designs,
- 400G coherent optical modulation analysis for long-haul network design testing, and
- 25G opto-electrical testing for validation of the critical 100GBASE-SR4 specification.
Tektronix will provide attendees with hands-on demonstrations and technical advice to help them solve their individual test and measurement challenges. On the stand will be the new DPO70000SX 70-GHz ATI Performance Oscilloscope featuring the low noise and high number of effective bits.
“I encourage ECOC visitors to attend the Tektronix open customer technology forum, presented by leading optical research and commercial enterprises at our booth. The various presentations will demonstrate how they used Tektronix technology measurement solutions to solve complex coherent optical and communication design challenges,” said Dean Miles, technical marketing manager at Tektronix. “We are looking forward to demonstrating these new solutions at the show. In addition, visitors to the Tektronix booth will be able to participate in a prize draw to win an Apple Watch.”
Highlights on the Tektronix stand this year will include the new OM4245 45-GHz Optical Modulation Analyzer (OMA), capable of supporting the latest 100G and next-gen 400G communications standards. With support for single-carrier or multi-carrier systems, the analyzer is tightly integrated with the Tektronix DPO70000SX 70-GHz ATI Performance Oscilloscope. The OM4245 is capable of dual-polarization coherent optical analysis up to 80 GBaud. It offers built-in, narrow linewidth lasers and supports the Tektronix OM-Series User Interface (OUI). Along with proven ease-of-use for typical analysis applications, the Tektronix OUI also provides the flexibility and access to the MATLAB computational engine researchers need for more advanced coherent optical analysis.
A new series of high-speed pattern generators and bit error detectors to support optical and serial data communications testing on signals as fast as 40 Gb/s will also be on display. The new 40 Gb/s PPG4001 pattern generator and PED4000 Series error detectors feature very high signal quality and jitter stress capabilities suitable for SerDes, component, and optical module testing. The PPG3000 Series pattern generators and PED3000 Series error detectors feature multi-channel pattern generation and error detection with channel-specific data programming, jitter insertion, and BER analysis ideal for critical margin testing on standards like 100G Ethernet, which require up to 4 channels.
In addition, the new 80C15C 32-GHz, single/multi-mode, broad wavelength optical sampling head is the latest addition to the extensive DSA8300 Digital Sampling Oscilloscope platform, offering a complete high-speed PHY Layer testing platform for data communications from 155Mb/sec to 100G.
At ECOC, Tektronix will also be demonstrating its extensive range of PHY layer test solutions: eye diagrams and jitter performance, stressed receiver testing, crosstalk and BER tests, and optical modulation analysis.
