Coherent Solutions debuts automatic bias controller for IQ modulators

Auckland, New Zealand. Coherent Solutions has announced the launch of the IQABC automatic bias controller for IQ modulators. The IQABC is another instrument added to Coherent Solutions’ product portfolio, which is targeted towards optical engineers working on coherent optical communications.

Bias control of an IQ-modulator is an essential part of the coherent optical communication system. The need for stable and accurate modulator bias control has become even more prominent with the next generation 400G systems employing 16QAM modulation formats due to its sensitivity to optimum bias control. The IQABC enables full automatic control of an IQ-modulator’s DC biases and is modulation format independent, paving the way towards simple generation of any conceivable optical signal.

The IQABC independently controls all DC biases, in automatic or manual mode, maintaining optimization against any bias drifts or changes to the driving signal. When connected with an OIF compatible IQ modulator, complex modulation formats such as mPSK and mQAM are stabilized by the IQABC’s robust algorithms, displaying stable and repeatable results.

The demand for ever increasing data rates has encouraged optical engineers to push the boundaries and develop more complex and higher bandwidth IQ modulators than ever before. IQABC will help engineers test and verify the reliability and performance of the IQ-modulators under test.

“The IQABC will relieve optical engineers of the rather frustrating task of modulator bias maintenance for higher order modulation formats. With its robust, modulation format independent algorithm, it simply just works.” said Andy Stevens, CEO of Coherent Solutions.

The IQABC is commercially available immediately and will be demonstrated live at OFC 2016 March 22-24 in Anaheim, CA.

www.coherent-solutions.com/iqabc

About the Author

Rick Nelson

Rick Nelson

Contributing Editor

Rick Nelson is a technical journalist who has served as executive editor of Test & Measurement World, chief editor of EDN, and executive editor of EE-Evaluation Engineering. He has also contributed to publications including Vision Systems Design and Electronic Design, and he has participated in many live panel discussions and webcasts. Rick has also held systems-engineering and product-development positions at General Electric and Litton Industries. He received his B.S.E.E. degree from The Pennsylvania State University.

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