FRAM passes auto stress test

Ramtron International's FM24CL16 16kbit, 3V, serial FRAM memory device is now qualified to AEC-Q100 (Automotive Electronic Council's Stress Test Qualification for Integrated Circuits) standards.
Dec. 6, 2006

Ramtron International's FM24CL16 16kbit, 3V, serial FRAM memory device is now qualified to AEC-Q100 (Automotive Electronic Council's Stress Test Qualification for Integrated Circuits) standards. The company plans to grow a broad line of AEC-Q100-qualified FRAM products to meet the design challenges of the automotive market. Ramtron is a developer and supplier of nonvolatile, ferroelectric, random-access-memory and integrated semiconductor products.

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