Electronic Design UPDATE e-Newsletter | March
26, 2008 ADVERTISEMENT
On-Line Tools for High-Speed Backplane Design
Register for your free access to DesignLink from Amphenol TCS. Perform trade-off analysis and “what if” scenarios at any phase of your backplane design, using Amphenol TCS's unique set of interactive backplane design tools. Reduce the decision time and identify cost reduction opportunities early. Download valuable technical information 24x7, including symbols and footprints, application notes, drawings, SPICE models and more. Click here to request access today. editor's view |How To Become A VP In Your Organization By Louis Frenzel, Communications/Test Editor
At some point in your career as an engineer, if you haven't already, you probably will decide whether you’ll stay with engineering or move into management and the executive ranks. It's a tough call. The geek in us may want to continue to create, design, and solve challenging problems, but the greater pay, perks, and prestige of management are irresistible. Read the full article...
Register for your free access to DesignLink from Amphenol TCS. Perform trade-off analysis and “what if” scenarios at any phase of your backplane design, using Amphenol TCS's unique set of interactive backplane design tools. Reduce the decision time and identify cost reduction opportunities early. Download valuable technical information 24x7, including symbols and footprints, application notes, drawings, SPICE models and more. Click here to request access today. editor's view |How To Become A VP In Your Organization By Louis Frenzel, Communications/Test Editor
At some point in your career as an engineer, if you haven't already, you probably will decide whether you’ll stay with engineering or move into management and the executive ranks. It's a tough call. The geek in us may want to continue to create, design, and solve challenging problems, but the greater pay, perks, and prestige of management are irresistible. Read the full article...
Our editors have been busy! Come read their commentaries and check
out exclusive videos from the Mobile World Congress, APEC, and Embedded World exhibitions and see the technology of
tomorrow from major players in the electronics industry.
focus on components |
HD/SD Video Filters Raise Performance
Bars
|
Dev Kits 2
|
Analog Multiplier Improves the Accuracy of
High-Side Current-Sense Measurements
|
ADVERTISEMENT
New Agilent VEE Pro 8.5 -- now with more enhancements to
simplify programming
Agilent VEE Pro 8.5 is an open and powerful graphical language environment that provides a quick and easy path to measurement and analysis. Keep programming simple with less lines of code with high-level task-oriented approach. Click here to watch our online demo or webcasts to learn more. Engineering TV | MIRTHE MIRTHE is a National Science Foundation Engineering Research Center headquartered at Princeton University, with partners City College New York, Johns Hopkins University, Rice, Texas A&M, and the University of Maryland Baltimore County. The center encompasses a world-class team of engineers, chemists, physicists, environmental and bio-engineers, and clinicians. MIRTHE's goal is to develop mid-infrared optical trace gas sensing systems based on new technologies such as quantum cascade lasers or quartz enhanced photo-acoustic spectroscopy, with the ability to detect minute amounts of chemicals found in the environment or atmosphere, emitted from spills, combustion, or natural sources, or exhaled.
Click here to watch the video
news from the editors |
The Ethernet Alliance announced that the IEEE P802.3at task force
has written IEEE P802.3at/Draft 3.0 and submitted it to the IEEE 802.3
working group for technical review. The task force expects to complete
the ratification process by 2009. Read the
full article...
Several upcoming plugfests conducted by the Ethernet Alliance will
give members a chance to demonstrate to the industry the
interoperability of various new Ethernet technologies. The sessions will
be held at the University of New Hampshire Interoperability Lab
(UNH-IOL). Read the
full article...
The X Prize Foundation and Progressive Insurance have announced the
company's title sponsorship of the Progressive Insurance Automotive X
Prize competition and its funding of the $10 million prize purse.
Read the
full article...
Agilent VEE Pro 8.5 is an open and powerful graphical language environment that provides a quick and easy path to measurement and analysis. Keep programming simple with less lines of code with high-level task-oriented approach. Click here to watch our online demo or webcasts to learn more. Engineering TV | MIRTHE MIRTHE is a National Science Foundation Engineering Research Center headquartered at Princeton University, with partners City College New York, Johns Hopkins University, Rice, Texas A&M, and the University of Maryland Baltimore County. The center encompasses a world-class team of engineers, chemists, physicists, environmental and bio-engineers, and clinicians. MIRTHE's goal is to develop mid-infrared optical trace gas sensing systems based on new technologies such as quantum cascade lasers or quartz enhanced photo-acoustic spectroscopy, with the ability to detect minute amounts of chemicals found in the environment or atmosphere, emitted from spills, combustion, or natural sources, or exhaled.
Click here to watch the video
news from the editors |
PoE Plus Draft 3.0 Ready For Technical
Review
|
Ethernet Alliance Schedules Plugfests
|
High-Mileage Auto Competition Announces $10
Million Prize
|
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ESC Silicon Valley: Learn Today, Design
Tomorrow
ESC Silicon Valley is where the global design engineering community gathers to learn, collaborate and celebrate innovation. ESC is celebrating 20 years of educating the creators of technology at the San Jose Convention Center from April 14 - 17 with over 350 exhibiting companies and over 200 new courses to this year's conference. Register today! Use Code: UX2-D
Agilent Technologies' Cover-Extend Technology is a hybrid between
two established test methods for manufacturing test: boundary scan and
VTEP vectorless test. Part of the company's VTEP v2.0 Powered test
suite, Cover-Extend offers a limited-access solution for in-circuit test
(ICT) users that eliminates the need for physical test points, providing
benefits that traditional VTEP cannot. Read the
full article...
quick poll |
In his April 10 Technology Report,
Contributing Editor Roger Allan will look at the latest in portable
video. What development will be most necessary before portable video
achieves portable audio's popularity?
Presented by LeCroy
April 9 at 2 pm ET This Web seminar, presented by LeCroy Business Development Manager Michael Schnecker, will describe the limitations of eye-pattern testing and some of the more important eye-based measurements. A measurement technique using the normalized q-scale method from jitter analysis and expanded to two dimensions will be described, and its application to mask testing and signal measurements will be demonstrated.
Click here to register
upcoming industry events | Multicore Expo
Santa Clara, Calif.
April 1-3 CTIA Wireless 2008
Las Vegas, Nev.
April 1-3 Embedded Systems Conference
San Jose, Calif.
April 14-18 ED bookstore |
Read up on Communication/Test Editor Louis Frenzel's reviews and
recommendations on two reference guides from the industiral networking
industry. Industrial Ethernet, 2nd Ed., by P.S. Marshall and J.S.
Rinaldi introduces how Ethernet carries the TCP/IP protocol suite, and
there is also coverage on Ethernet hardware. The second book,
Industrial Data Communications, 4th Ed., by L.M. Thompson, covers
a rainbow of topics within the serial-data communications field.
Read the
full article...
ESC Silicon Valley is where the global design engineering community gathers to learn, collaborate and celebrate innovation. ESC is celebrating 20 years of educating the creators of technology at the San Jose Convention Center from April 14 - 17 with over 350 exhibiting companies and over 200 new courses to this year's conference. Register today! Use Code: UX2-D
Agilent Eliminates Need For Physical Test
Points For ICT
|
- More processing muscle
- Streamlined software and standards
- Better power efficiency
- A wider selection of content
- Other
Click here to take the poll. Remember to scroll down, the poll is at the bottom of the page.
Presented by LeCroy
April 9 at 2 pm ET This Web seminar, presented by LeCroy Business Development Manager Michael Schnecker, will describe the limitations of eye-pattern testing and some of the more important eye-based measurements. A measurement technique using the normalized q-scale method from jitter analysis and expanded to two dimensions will be described, and its application to mask testing and signal measurements will be demonstrated.
Click here to register
upcoming industry events | Multicore Expo
Santa Clara, Calif.
April 1-3 CTIA Wireless 2008
Las Vegas, Nev.
April 1-3 Embedded Systems Conference
San Jose, Calif.
April 14-18 ED bookstore |
Industrial Networking: Two Selections
|
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