Teseq system meets new immunity testing requirements

April 6, 2015

Teseq now offers a system that meets the new requirements for immunity testing to low-frequency disturbances in the frequency range of 15 Hz to 150 kHz. The NSG 4060 complies with current testing standards including EN 61326-3-1, IEC 61850-3, IEC 60255-22-7, IEC 60533/IEC 60945, IEC 61000-4-16, and IEC 61000-4-19.

Suitable for use by manufacturers of smart electrical meters, industrial circuit breakers, and industrial Ethernet and shipboard equipment, the NSG 4060 is a robust system with extensive features and a best-in-class user interface with an intuitive front panel that enables the unit to run fully compliant tests without a PC. It accurately tests low-frequency immunity in common and differential mode.

The new test system features a full range of verification accessories and ensures compatibility of components. These accessories allow in-house confidence checking of differential CDN (CDND).

Disturbances are coupled onto cables in common mode (IEC/EN 61000-4-16) or differential mode (IEC/EN 61000-4-19) with continuous levels ranging from 1 V to 30 V. The NSG 4060 features an extension unit that expands the test range frequency to DC and the amplitude to 300 V for short-term tests.

This new unit, which combines a signal generator and integrated power amplifier, features a user port for four TTL inputs and four TTL outputs as well as supply voltages for individual monitoring and control applications. There are also ports for generator output, system, and coupling network control as well as phase synchronization input.

A remote-control option is available through an optical RS-232, LAN, or USB. Two USB, analog, digital, and optical EUT monitoring inputs and external modulation input come standard on each unit.

The NSG 4060 shares the same chassis and user interface as the NSG 4070 RF conducted immunity system, featuring the same user-friendly 5.7” color display, and hard keys for important functions.

A user manual with extensive set-up diagrams and instructions is included with each unit.

http://www.teseq.com

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!