Dual, In-Line Test Sockets Withstand Temps Up To 250¡C

Nov. 1, 1998
Designed to withstand 25,000 to 50,000 test cycles in environments up to 250°C, the Series X55X zero-insertion-force, dual-in-line test sockets' contacts are closed to eliminate dependence on plastic to maintain contact. Retention force when

Designed to withstand 25,000 to 50,000 test cycles in environments up to 250°C, the Series X55X zero-insertion-force, dual-in-line test sockets' contacts are closed to eliminate dependence on plastic to maintain contact. Retention force when closed is 55 grams/pin based upon a 0.020" test lead. The socket handle can be configured to have closed contacts in the up or down position and can be mounted on the right or left side. Sockets can be soldered directly to boards or plugged into other sockets such as the firm's Series 6556 receptacles and other manufacturers' units. These universal test sockets accept devices on 0.300" to 0.600" centers and pin counts from 24 to 48.

Company: ARIES ELECTRONICS INC.

Product URL: Click here for more information

About the Author

Staff

Articles, galleries, and recent work by members of Electronic Design's editorial staff.

Sponsored Recommendations

Comments

To join the conversation, and become an exclusive member of Electronic Design, create an account today!