Multi-function JTAG Module Addresses Analog Testing

June 22, 2012
JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (digital/analog/frequency) measurement module
JTAG Technologies has introduced the JT 2149/DAF, a compact, mixed-signal (digital/analog/frequency) measurement module. It is the first unit of its type to offer both digital and analog test access to PCBs via the company's widely-used QuadPod signal conditioning interface. The module has been designed to slot into the regular QuadPod transceiver system as used by the DataBlaster series of boundary-scan/JTAG controller hardware. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests with a series of analog and frequency measurements. Capabilities of the JT 2149/DAF include 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6 V plus frequency measurements of up to 128 MHz on any pin. Twelve additional analog measurement channels can capture values from 0 to 33 V with better than 10 mV resolution. One further channel is available as a clock generator, programmable up to 64 MHz. The JT 2149/DAF can be controlled through an interactive panel within JTAG ProVision as well as through Python scripts. A full Python API is included as part of JTAG Technologies current ProVision releases. The modules are available immediately.

JTAG TECHNOLOGIES

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