The cost of digital testing can be dramatically reduced, it's claimed, with a boundary-scan controlled ScanIO-280LV digital module with programmable voltage levels. The device is targeted at development, manufacturing and service test applications for
The cost of digital testing can be dramatically reduced, it's claimed, with a boundary-scan controlled ScanIO-280LV digital module with programmable voltage levels. The device is targeted at development, manufacturing and service test applications for both pc boards and complex ICs. The module provides 288 boundary-scan controlled bi-directional I/O pins that can be used to add test coverage to non-scanable or partially scanable circuit boards and ICs. The modules can be cascaded to support thousands of I/Os. Applications include production test, service diagnostics, and prototype debugging of both pc boards as well as digital ICs, including ASICs and MCMs. The digital I/O pins of the modules can be connected to the device under test using conventional techniques. Call for pricing.
