Test Platform Addresses Differential Technologies

These front ends for the HP 81200 data generator/analyzer instruments are designed to expedite the characterization and verification of high-speed devices that use differential technologies, such as low voltage differential signaling (LVDS), emitter-coupled logic (ECL), and positive-biased emitter-coupled logic (PECL). By installing these front-end options into the instruments, engineers are provided the means for testing integrated circuits used in applications such as flat-panel displays and multimedia peripheral links at low voltages and speeds up to 660 MHz. The options are available now.