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Modelithics Rolls Out Models for Mini-Circuits’ Amplifiers

April 23, 2020
Modelithics now offers over 68 models, representing over 130 individual Mini-Circuits components, that include amplifiers, filters, and splitters, among others.

Modelithics Inc. and Mini-Circuits have expanded their partnership by developing new high-accuracy simulation models for several packaged Mini-Circuits amplifiers. In total, 14 new substrate amplifier models have been developed. These data-based models were extracted by performing broadband S-parameter and noise-parameter measurements with a Keysight PNA-X vector network analyzer (VNA), as part of a Maury Microwave ultra-fast noise parameter measurement setup.

Modelithics now offers over 68 models, representing over 130 individual Mini-Circuits components, that include amplifiers, filters, and splitters, among others. All the new amplifier models are currently available free for use within Keysight Technologies’ PathWave Advanced Design System (ADS). The models can be downloaded from the Mini-Circuits MVP page on the Modelithics website. The models are also conveniently available to all Modelithics Library customers in the newest version (v20) of the Modelithics COMPLETE Library for Keysight ADS. Free 90-day trials for the Modelithics Mini-Circuits Library are also available for use in other EDA simulation tools through the Modelithics Vendor Partner (MVP) Program. These tools include AWR Design Environment/Microwave Office, Keysight Technologies’ Genesys, Ansys HFSS, Sonnet Suites, and Cadence Virtuoso Spectre RF.

Request a trial by visiting the Modelithics Mini-Circuits MVP landing page (link above) and clicking on “Free Trial.” The MVP program facilitates proactive communication and collaboration with leading component and IC vendors as well as instrumentation and EDA software suppliers. Contact Modelithics at [email protected] for more information.

About the Author

David Maliniak | MWRF Executive Editor

In his long career in the B2B electronics-industry media, David Maliniak has held editorial roles as both generalist and specialist. As Components Editor and, later, as Editor in Chief of EE Product News, David gained breadth of experience in covering the industry at large. In serving as EDA/Test and Measurement Technology Editor at Electronic Design, he developed deep insight into those complex areas of technology. Most recently, David worked in technical marketing communications at Teledyne LeCroy. David earned a B.A. in journalism at New York University.

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