March 27, 2014. VTI Instruments announced that its EMX-2500 Gigabit Ethernet interface for the sentinelEX PXI Express family has achieved LXI 1.4 certification. In addition to LXI core functionality, the EMX-2500 achieved certification compliance for LXI extended functions including IEEE-1588 clock synchronization, LAN Event messaging, time-stamped data, IPV6, and LXI Event logs. This certification is a significant milestone as it enables end users to distribute VTI's precision PXI Express-based data acquisition instrumentation across a large test article while maintaining precise synchronization of acquired data.
“The flexibility that we provide through our modular data acquisition product line offers unique benefits to our customers that cannot be found in other solutions. The EMX-2500 allows our sentinelEX products to be distributed in a networked environment, with tight synchronization of data, while supporting throughput rates of up to 100 MB/s per chassis. For applications that require higher throughput, but not the level of synchronization that the EMX-2500 offers, a cabled PCI Express interface can be swapped into the same mainframe, using the same API, to achieve up to 2 GB/s data rates.” said Chris Gibson, data acquisition product manager.
The LXI specification defines IEEE-1588 as the mechanism for precisely synchronizing networked instrumentation clocks. The clock synchronization between a single master instrument and multiple slaves is achieved using standard Ethernet cables, resulting in simplified installation and maintenance.
“Customer demands for reduced analog signal cabling are driving measurement hardware closer to the article under test, forcing the need for a distributed, networked infrastructure,” continued Gibson. “The ability to precisely synchronize system clocks and accurately time-stamp data are critical factors to be considered when creating a distributed instrumentation network. By integrating IEEE-1588 clock synchronization capability into our modular data acquisition product line, measurements acquired in multiple mainframes can be tightly correlated in time, removing any guesswork from post-acquisition analysis.”