JTAG Partners With Sanmina-SCI

April 16, 2012. JTAG Technologies, a provider of IEEE 1149.x boundary-scan test equipment, has announced that Sanmina-SCI, a manufacturing solutions company making optical, electronic, and mechanical products, will be using JTAG’s boundary scan tools for prototype testing at its Haukipudas Oy facility.

Sanmina-SCI will use boundary scan to complement traditional ICT or flying probe test methods to create an all-embracing test strategy with high test coverage for both the digital and analog sections in a platform for the use in prototype testing, manufacturing test, and in-system programming.

Sanmina SCI Plant Manager Eeva-Liisa Kylmänen said, “The JTAG Technologies’ testing capability enhances, for example, our test services/tools in our NPI (new product introduction) function. Together with FPT (flying probe test) and/or AOI (automatic optical inspection), JTAG testing provides good test coverage for prototype testing.”

Peter van den Eijnden, Managing Director JTAG Technologies commented, “We are delighted with this extended partnership with Sanmina SCI as we complement each other in  support and knowledge for the growing Finnish EMS market. Through this partnership Sanmina SCI can broaden its boundary-scan technology knowledge and service to its current and new customers”.


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