December 18, 2012. Tektronix Inc. today announced a new series of high-speed pattern generators and error detectors to support optical and serial data communications testing on signals as fast as 32 Gb/s. The new PPG3000 Series Pattern Generators and PED3000 Series Bit Error Detectors feature multi-channel pattern generation with channel-specific data programming suitable for critical margin testing on critical standards like 100G Ethernet, which require up to four channels.
The market incentive to develop high-speed optical and data communications links is greater than ever as bandwidth-hungry smart phones, tablets, and video applications continue their rapid growth. Data communications researchers and designers in turn need high-speed test equipment for characterizing and testing optical and serial interfaces that typically employ multiple channels with data rates ranging from 10 to 32 Gb/s per channel.
For testing coherent optical modulation formats, such as DP-QPSK, the PPG3000 Series, with its four phase-aligned channels, can be used in conjunction with the Tektronix OM4000 Series Coherent Lightwave Signal Analyzer to enable optical designers to optimize and validate coherent modulation formats in real-time.
For bit error rate testing, the PED3000 Series can be combined with the PPG3000 to provide up to 32-Gb/s BER analysis with multi-channel support for quick identification of crosstalk issues common in multilane data communications architectures. For example, with IEEE 802.3ba standards test, designers can simulate a 4 x 28G test bench to stress-test their receivers’ designs. The 32-Gb/s data rate output with adjustable jitter insertion enables design firms to bring product to market with high margin capabilities, improving yields and performance of their end products or chips.
“The addition of the PPG3000 and PED3000 Series to our BERT portfolio enables us to provide customers with choices for critical 100G standards testing,” said Brian Reich, general manager for performance oscilloscopes at Tektronix. “For in-depth analysis requiring exacting signal integrity we continue to offer our award-winning BERTScope family. The new PPG3000 and PED3000 add the ability to conduct BERT tests that require multi-channel aligned data pattern generation up to 32 Gb/s.”
Multi-channel Pattern Generation
Consisting of six models in total, the PPG3000 Series includes models with 30-Gb/s or 32-Gb/s speeds and with one, two, or four channels. With features such as synchronized and phase-adjustable outputs and PRBS or user-defined pattern generation, these instruments provide the flexibility needed to troubleshoot a range of design issues including crosstalk. As speeds increase and multilane configurations such as 100G Ethernet become commonplace, crosstalk has emerged as a major design challenge.
Available with either one or two channels, the PED3000 Series of error detectors enable testing of multi-channel standards like 100G Ethernet. The instruments combine sensitivity (<20 mV measured at 30 Gb/s) with a data range from 32 Mb/s to 32 Gb/s. Error checking functions include PRBS or user-defined patterns, DC-coupled differential data inputs, single-ended clock input, and auto align to input pattern.
The PPG3000 Series Pattern Generators and PED3000 Series Error Detectors will be available in late December 2012. Pricing starts at $85,000.