Agilent to Exhibit at IPC APEX EXPO

February 5, 2013. Agilent Technologies Inc. announced it will demonstrate its latest boundary-scan analyzer plus inline in-circuit and functional test systems at the IPC APEX EXPO, February 19-21 in San Diego.

These latest innovations provide greater flexibility, allowing users to re-use tests and hardware investments all the way from design validation and prototyping through pre-ramp-up and mass manufacturing phases.

Agilent experts will demonstrate these products:

A versatile new boundary-scan analyzer. It offers quick test turn-around and extensive coverage, from design and validation to new product introduction and mass manufacturing.
The low-cost Medalist i1000D ICT. This system comes complete with an integrated board handler for automating manufacturing tests of smartphones, LEDs, automotive fuse boxes, and more. The i1000D includes digital testing, boundary scan and serial programming capabilities.
The fully integrated inline Medalist i3070 Series 5 in-circuit test system with short-wire fixturing, known for its ease of test transportability and repeatability. This suite includes limited-access tests, LED tests, and an easy-to-use interface.
The Agilent i1000D diagnostics test set, a custom, modular ICT-featured instrument. For use in R&D, repair, and functional test, it provides faster prototype turn-on and precise repair diagnostics.

Solution partners will also be present in the Agilent booth, demonstrating cost-effective, state-of-the-art software for analysis, simulation, and implementation of the most demanding circuit-board production tests.