Anritsu addresses high-speed design, test challenges for next generation networks

Jan. 27, 2015

Anritsu will provide engineers developing leading-edge products with solutions to meet their most challenging test requirements during DesignCon 2015, to be held January 28-29 in Santa Clara, CA. The company will host a series of technical sessions, conduct booth demonstrations incorporating products from similar industry leaders, and showcase signal integrity solutions to help engineers prove their high-speed designs, speed product time-to-market and reduce the overall cost of test.

“As a market leader, we recognize the importance of providing engineers with test solutions that mitigate challenges and meet current and future requirements. We also believe in providing educational support and participating in partnerships and collaborations that will bring short- and long-term benefits to help move technology forward. At DesignCon 2015, Anritsu will be exhibiting all of these elements to help engineers prove their advanced designs,” said Pete Alexander, PhD, vice president and general manager of Anritsu Company.

On Thursday, January 29, Anritsu will host a full day of technical sessions. Among the topics will be conducting accurate ultra-high-speed signal integrity BER measurements, high-speed channel testing, jitter tests in 100G+ applications, the importance of VNAs and S-parameter measurements in high-frequency applications, and testing AOC/DAC QSFP+ cables.

Collaborative booth demonstrations will offer insight and solutions to design challenges faced by signal integrity engineers developing high-speed products and systems. In one technical display, the Anritsu MP1800A BERT Signal Quality Analyzer will be teamed with a Teledyne LeCroy 10 Zi oscilloscope to showcase how engineers can successfully develop high-speed channels using 32G NRZ and PAM4 waveform generation and jitter analysis. The VectorStar Vector Network Analyzer (VNA) will be part of a demonstration on signal integrity analysis of advanced dielectric materials in the Isola booth, as well.

Additional test capabilities of the MP1800A and VectorStar will be displayed in the Anritsu DesignCon 2015 booth. The MP1800A will be shown in various configurations, including as a complete 32G jitter tolerance test solution, for high-speed 64G PAM4 signal generation and analysis, and to determine the spectral content of high-speed SerDes signals. VectorStar will be the centerpiece of a 40 GHz 4-port signal integrity solution, and a new 4-port 70 kHz – 110 GHz broadband VNA system will also be shown. Engineers can also learn the advantages of the VectorStar when conducting differential S-parameter measurements.

For engineers involved in Optical Transport Network (OTN) development, Anritsu will spotlight its new Network Master Flex MT1100A. The transport tester is the first handheld instrument of its kind that can send and receive a variety of 100G × 4 client signals to support R&D of 400 Gbps networks and transport equipment.


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