TekScope Anywhere enhances collaboration, boosts productivity
Santa Clara, CA. Tektronix Inc. chose DesignCon to highlight TekScope Anywhere, a new software offering that extends the visualization, analysis, and reporting capabilities found on Tektronix oscilloscopes to Microsoft Windows-based PCs, tablets, and servers. TekScope anywhere decouples analysis tools from the oscilloscope, enabling engineers to do much of their work away from the lab, gain advice from colleagues or managers who are away from the lab, and in general collaborate more effectively with colleagues around the world.
The use of TekScope Anywhere starts with an oscilloscope to collect waveform data and measurement results. From there, a set of common analysis tools are available independent of the hardware used to make the acquisition. TekScope Anywhere supports a broad set of waveform formats from oscilloscopes or simulation environments, including .h5, .wfm, .csv, .bin, .trc, and .tr0.
In the DesignCon demonstration, Tektronix personnel at the company’s booth in Santa Clara were able to able to visualize, analyze, and otherwise manipulate data from an oscilloscope “session” collected by a colleague using an oscilloscope located at the company’s headquarters in Beaverton, OR.
A spokesperson said TekScope Anywhere also supports analysis being done prior to arrival of silicon in simulation. For these scenarios, TekScope Anywhere enables measurements on simulation data using the same algorithms that the oscilloscope will use during silicon PHY characterization post-fabrication.
“TekScope Anywhere enables our oscilloscope customers to collaborate and work in a more flexible environment,” said Brian Reich, general manager, Performance Oscilloscopes, Tektronix, in a press release. “For example, customers can now solve measurement correlation issues across multiple waveform formats from a variety of scopes and simulation environments—independent of the scope hardware.”
To speed up analysis, TekScope Anywhere features a composite save/recall function to help users get started at the right place every time. An included measurement library offers over 70 measurements, including parametric, jitter, and eye diagrams. Visualizations include waveform and plot displays with interactions for zooming, cursors, and annotations along with math support for basic operations including arithmetic operands, FFTs, and arbitrary filters. Advanced jitter measurements are available when equipped with Option DJA.
Session files, including configuration and measurement details, can be saved on any Tektronix MSO/DPO5000, DPO7000, or MSO/DPO70000 series oscilloscope and used within TekScope Anywhere, eliminating the need to re-configure hardware setups. Adding to its collaboration capabilities, measurement results can be compared simultaneously across multiple waveforms and reports easily generated with the results.
Currently in limited release for evaluation, TekScope Anywhere will be available to order in March 2015 worldwide. Pricing starts at $895. Option DJA for in-depth jitter analysis is priced at $5,000.
