“When Exposed to IoT, Big Iron ATE Will Rust”—that’s the provocative title of one section of National Instruments’ NI Trend Watch 2015. The authors cite Gartner estimates that by 2022, each household could have more than 500 connected devices—the production of which will present automated test challenges.

Traditional ATE, the authors write, is very good at testing mostly digital devices with high transistor counts. But innovative approaches are required to test IoT devices with digital, analog, and RF signals plus antennas—at consumer volumes and at the lowest possible cost.

Moreover, traditional product cycles involving fixed-function instruments for development and characterization and separate proprietary ATE systems for production test will not support getting products to market on time, they say.

The authors offer three alternatives: move the production tester into the lab, take the lab instruments onto the production floor, or invest in test equipment that scales from design to production—with software playing a key role.

Visit NI Trend Watch 2015 for more.