Rohde & Schwarz unveils new USB and LAN diode sensors

Feb. 20, 2015

Rohde & Schwarz has announced its new R&S NRPxxS and R&S NRPxxSN USB three-path diode power sensors. The completely redesigned sensors offer improved measurement speed and measurement accuracy, even at low levels. The R&S NRPxxSN model offers both a USB and a LAN interface. Both power sensor models are available for three different frequency ranges, from 10 MHz to 8 GHz, to 18 GHz, and to 33 GHz.

The R&S NRPxxS/SN sensors enable 10,000 triggered measurements per second with a minimum trigger resolution of 100 µs. A special mode even permits in excess of 50,000 equidistant measurements per second. And the improved three-path diode design makes it possible to decrease the lower measurement limit to -70 dBm. The result is a wide dynamic range of 93 dB and instruments that can measure up to four times faster than previous solutions, especially at low levels.

LAN operation via web browser

The new LAN interface on the R&S NRPxxSN model now allows remote power measurements over large distances. For example, it is possible to control monitoring applications for satellite systems or particle accelerators via a central PC by placing sensors at various positions in the system. The power sensor is conveniently controlled from a GUI accessed via web browser. No additional software is needed.

Numerous test modes for a variety of applications

R&S NRPxxS/SN power sensors help mobile communications users perform power measurements on signals such as GSM, 3GPP, LTE, and LTE-Advanced. The 33-GHz model is also suitable for development and production of anticollision radar systems in the automotive sector. The continuous average, burst average, timeslot average, gate average, and trace measurement test modes all remain available.

The new R&S NRP8S, R&S NRP18S and R&S NRP33S USB three-path diode sensors and the R&S NRP8SN, R&S NRP18SN and R&S NRP33SN USB/LAN diode sensors are now available.

www.rohde-schwarz.com/ad/press/powersensors

About the Author

Rick Nelson | Contributing Editor

Rick is currently Contributing Technical Editor. He was Executive Editor for EE in 2011-2018. Previously he served on several publications, including EDN and Vision Systems Design, and has received awards for signed editorials from the American Society of Business Publication Editors. He began as a design engineer at General Electric and Litton Industries and earned a BSEE degree from Penn State.

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